-HAIXUNPRESS-UNISOC has completed the 5G standalone (SA) chip interoperability test based on the 3GPP R15 F60 version and the ZUC performance test together with major system vendors.
The tests were organized by the IMT-2020 (5G) Promotion Group, conducted at the China Academy of Information and Communications Technology (CAICT), using a smartphone powered by UNISOC T7510. UNISOC has completed the 5G SA chip interoperability testing with ZTE, Nokia Shanghai Bell, Ericsson, and the ZUC performance testing with ZTE.
The Multi-vendor 5G SA chip interoperability tests have completed all the testing items as more than 280, covered the physical layer, RRC layer, NAS layer, service bearing, network slicing and NR-LTE mobility of 5G SA, as well as EPS Fallback.
In ZUC performance testing, the smartphone powered by UNISOC T7510 successfully completed the testing of a total of 18 use cases for the up/down rate and delay testing of ZUC algorithm encryption and integrity protection in the data level.
ZUC algorithm, also known as Zu Chongzhi algorithm, was listed as the core part in the third international encryption and integrity protection algorithms by 3GPP. It will be used to build a more secure 5G network to meet the security requirements of vertical industries.
As a leading fabless semiconductor company, UNISOC has completed interoperability testing with a number of other major system vendors, working with partners to promote the maturity of the 5G SA industry to lay a good technical foundation, enabling vertical industries adoption of 5G technologies.
Disclaimer: This article is reproduced from other media. The purpose of reprinting is to convey more information. It does not mean that this website agrees with its views and is responsible for its authenticity, and does not bear any legal responsibility. All resources on this site are collected on the Internet. The purpose of sharing is for everyone's learning and reference only. If there is copyright or intellectual property infringement, please leave us a message.
©copyright2009-2020New York Fashion News Contact Us SiteMap